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[IEEE 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Lviv, Ukraine (2007.2.19-2007.2.24)] 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Comprehensive Approach to Web Applications Testing and Performance Analysis
Murlewski, Jan, Wojciechowski, Jaroslaw, Sakowicz, Bartosz, Napieralski, AndrzejYear:
2007
Language:
english
DOI:
10.1109/CADSM.2007.4297607
File:
PDF, 378 KB
english, 2007