Thin dE/dx detectors of uniform thickness made on epitaxial...

Nuclear Instruments and Methods 1973 Vol. 112; Iss. 3

Thin dE/dx detectors of uniform thickness made on epitaxial silicon

J.P. Ponpon, P. Siffert, F. Vazeille
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Volume:
112
Year:
1973
Language:
english
Pages:
3
DOI:
10.1016/0029-554x(73)90163-8
File:
PDF, 159 KB
english, 1973
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