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The promising multi-bit/level programming operations for nano-scaled SONOS memory
Ji, Xiao-li, Wu, Chun-bo, Xu, Yue, Liao, Yi-ming, Chang, Jian-guang, Ma, Li-juang, Yan, FengVolume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.133
Date:
January, 2014
File:
PDF, 680 KB
english, 2014