![](/img/cover-not-exists.png)
A method for accurately determining the thickness dimensions and photon-intensity corrections of a thick, covered, photon source
William J. Gallagher, Sam J. CipollaVolume:
125
Year:
1975
Language:
english
Pages:
8
DOI:
10.1016/0029-554x(75)90278-5
File:
PDF, 478 KB
english, 1975