Trace element analysis in thick targets by charged particle...

Trace element analysis in thick targets by charged particle induced X-rays

Bijoy K. Patnaik, Neelkanth G. Dhere
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Volume:
131
Year:
1975
Language:
english
Pages:
7
DOI:
10.1016/0029-554x(75)90441-3
File:
PDF, 349 KB
english, 1975
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