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The use of a photoelastic modulator in measuring radiation damage in birefringent samples caused by energetic charged particles
C.F. Wong, H.D. Ellis, R. NortonVolume:
154
Year:
1978
Language:
english
Pages:
5
DOI:
10.1016/0029-554x(78)90427-5
File:
PDF, 245 KB
english, 1978