A plasma ion source with plane beam profile for UHV-SIMS...

A plasma ion source with plane beam profile for UHV-SIMS measurements

Klaus-Dieter Klöppel, Wolfhart Seidel
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Volume:
177
Year:
1980
Language:
english
Pages:
7
DOI:
10.1016/0029-554x(80)90038-5
File:
PDF, 454 KB
english, 1980
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