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Investigation of thickness dependence on electronic structures of iron and nickel thin films by L-edge X-ray absorption spectroscopy
Akgul, Guvenc, Akgul, Funda Aksoy, Ufuktepe, YukselVolume:
99
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2013.06.003
Date:
January, 2014
File:
PDF, 1.13 MB
english, 2014