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Variation of nitrogen incorporation and bonding configuration of carbon nitride films studied by X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared (FT-IR) spectroscopic ellipsometry
Kennou, S., Logothetidis, S., Sygellou, L., Laskarakis, A., Sotiropoulou, D., Panayiotatos, Y.Volume:
11
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(01)00584-2
Date:
March, 2002
File:
PDF, 134 KB
english, 2002