Theoretical analysis of sputter profiling

Theoretical analysis of sputter profiling

Remmerie, J., Maes, H.E.
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Volume:
40
Language:
english
Journal:
Spectrochimica Acta Part B: Atomic Spectroscopy
DOI:
10.1016/0584-8547(85)80130-0
Date:
January, 1985
File:
PDF, 486 KB
english, 1985
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