On the formation of an interface amorphous layer in...

Applied Surface Science 2013 / 8 Vol. 278

On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt–Si and its effect on the electrical properties

Silva, J.P.B., Sekhar, K.C., Rodrigues, S.A.S., Pereira, M., Parisini, A., Alves, E., Barradas, N.P., Gomes, M.J.M.
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Volume:
278
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2012.11.161
Date:
August, 2013
File:
PDF, 811 KB
english, 2013
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