Focused ion beam milling of exfoliated graphene for...

Microelectronic Engineering 2012 / 10 Vol. 98

Focused ion beam milling of exfoliated graphene for prototyping of electronic devices

Schmidt, Marek E., Johari, Zaharah, Ismail, Razali, Mizuta, Hiroshi, Chong, Harold M.H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
98
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2012.07.090
Date:
October, 2012
File:
PDF, 692 KB
english, 2012
Conversion to is in progress
Conversion to is failed