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Picosecond transient grating measurement of orientational effects in semiconductors
Thomas F. Boggess, Arthur L. Smirl, B.S. WherrettVolume:
43
Year:
1982
Language:
english
Pages:
6
DOI:
10.1016/0030-4018(82)90106-7
File:
PDF, 567 KB
english, 1982