Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Grazing Incidence Configurations
Birkholz, MarioVolume:
10.1002/35
Year:
2005
Language:
english
Pages:
40
DOI:
10.1002/3527607595.ch4
File:
PDF, 601 KB
english, 2005