A Built-In Self-Test (BIST) system with non-intrusive TPG...

Microelectronics Reliability 2013 / 3 Vol. 53; Iss. 3

A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis

Ruan, Aiwu, Kang, Shi, Wang, Yu, Han, Xiao, Zhu, Zujian, Liao, Yongbo, Li, Peng
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.09.013
Date:
March, 2013
File:
PDF, 1.30 MB
english, 2013
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