RBS depth profiling and optical characterization of...

Materials Chemistry and Physics 2013 / 4 Vol. 139; Iss. 1

RBS depth profiling and optical characterization of multilayers of TiO2 (20 nm) and Ge (15 nm)

Hussain, Mirza Sajjad, Mehmood, Mazhar, Ahmad, Jamil, Tanvir, M. Tauseef, Khan, A. Faheem, Ali, Turab, Mahmood, Arshad
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Volume:
139
Language:
english
Journal:
Materials Chemistry and Physics
DOI:
10.1016/j.matchemphys.2012.10.037
Date:
April, 2013
File:
PDF, 1.29 MB
english, 2013
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