Fluorescence lifetime measurement of semiconductor doped...

Fluorescence lifetime measurement of semiconductor doped glass by using an incoherent light gated optical Kerr shutter

Hiroki Nakatsuka, Yoshitaka Katsahima, Kazuki Inouye, Ryuzi Yano, Sadao Uemura
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Volume:
74
Year:
1989
Language:
english
Pages:
4
DOI:
10.1016/0030-4018(89)90353-2
File:
PDF, 240 KB
english, 1989
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