Measurement of the biexciton level width of CuCl at k ∼ 0...

Measurement of the biexciton level width of CuCl at k ∼ 0 with a Ti-sapphire ring laser

M. Hasuo, N. Nagasawa, T. Itoh
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Volume:
85
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0030-4018(91)90398-w
File:
PDF, 230 KB
english, 1991
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