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Optical and dielectric results of Y0.225Sr0.775CoO3±δ thin films studied by spectroscopic ellipsometry technique
Ali, A.I., Son, J.Y., Ammar, A.H., Abdel Moez, A., Kim, Y.S.Volume:
3
Year:
2013
Language:
english
Journal:
Results in Physics
DOI:
10.1016/j.rinp.2013.08.004
File:
PDF, 1.20 MB
english, 2013