Study of body and oxide thickness variation on analog and...

Microelectronics Reliability 2014 / 06 Vol. 54; Iss. 6-7

Study of body and oxide thickness variation on analog and RF performance of underlap DG-MOSFETs

Pati, Sudhansu Kumar, Koley, Kalyan, Dutta, Arka, Mohankumar, N., Sarkar, Chandan K.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.02.008
Date:
June, 2014
File:
PDF, 910 KB
english, 2014
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