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On the gm/ID-based approaches for threshold voltage extraction in advanced MOSFETs and their application to ultra-thin body SOI MOSFETs
Rudenko, T., Md Arshad, M.K., Raskin, J.-P., Nazarov, A., Flandre, D., Kilchytska, V.Volume:
97
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.04.029
Date:
July, 2014
File:
PDF, 1.33 MB
english, 2014