Using far-infrared two-photon excitation to measure the...

Optics Communications 1996 Vol. 124; Iss. 3-4

Using far-infrared two-photon excitation to measure the resonant-polaron effect in the Reststrahlen band of GaAs:Si

P.C.M. Planken, H.P.M. Pellemans, P.C. van Son, J.N. Hovenier, T.O. Klaassen, W.Th. Wenckebach, P.W. Barmby, J.L. Dunn, C.A. Bates, C.T. Foxon, C.J.G.M. Langerak
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Volume:
124
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0030-4018(95)00676-1
File:
PDF, 476 KB
english, 1996
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