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Diffusion length and resistivity distribution characteristics of silicon wafer by photoluminescence
Baek, Dohyun, Lee, Jaehyeong, Choi, ByoungdeogVolume:
58
Language:
english
Journal:
Materials Research Bulletin
DOI:
10.1016/j.materresbull.2014.03.002
Date:
October, 2014
File:
PDF, 3.37 MB
english, 2014