Determining polarity and dislocation core structures at...

Ultramicroscopy 2013 / 3 Vol. 126

Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0001)6H-SiC from a single image in HRTEM

Cui, Y.X., Wang, Y.M., Wen, C., Ge, B.H., Li, F.H., Chen, Y., Chen, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
126
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.11.008
Date:
March, 2013
File:
PDF, 1.69 MB
english, 2013
Conversion to is in progress
Conversion to is failed