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Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0001)6H-SiC from a single image in HRTEM
Cui, Y.X., Wang, Y.M., Wen, C., Ge, B.H., Li, F.H., Chen, Y., Chen, H.Volume:
126
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.11.008
Date:
March, 2013
File:
PDF, 1.69 MB
english, 2013