X-ray photoelectron spectroscopy surface analysis of...

Journal of Fluorine Chemistry 2014 / 2 Vol. 158

X-ray photoelectron spectroscopy surface analysis of fluoride stress in tea (Camellia sinensis (L.) O. Kuntze) leaves

Cai, Hui-mei, Peng, Chuan-yi, Chen, Jing, Hou, Ru-yan, Gao, Hong-jian, Wan, Xiao-chun
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Volume:
158
Language:
english
Journal:
Journal of Fluorine Chemistry
DOI:
10.1016/j.jfluchem.2013.11.012
Date:
February, 2014
File:
PDF, 804 KB
english, 2014
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