Aberration-corrected STEM/TEM imaging at 15kV
Sasaki, Takeo, Sawada, Hidetaka, Hosokawa, Fumio, Sato, Yuta, Suenaga, KazuVolume:
145
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2014.04.006
Date:
October, 2014
File:
PDF, 2.80 MB
english, 2014