The effect of Al2O3 passivation layer in...

Thin Solid Films 2014 / 05 Vol. 558

The effect of Al2O3 passivation layer in pulsed-laser-deposited ZrO2 films on n-GaAs substrate as a function of post-annealing temperature

Chae, Jimin, Kim, Hyo-Jin, Park, Sang Han, Cho, Sang Wan, Cho, Mann-Ho
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Volume:
558
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.02.061
Date:
May, 2014
File:
PDF, 1004 KB
english, 2014
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