Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2014 / 02 Vol. 736
![](/img/cover-not-exists.png)
Structural characterization of “as-deposited” cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques
Triloki,, Garg, P., Rai, R., Singh, B.K.Volume:
736
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2013.10.075
Date:
February, 2014
File:
PDF, 956 KB
english, 2014