Characterization of subnanometric layers by grazing...

Thin Solid Films 2014 / 04 Vol. 556

Characterization of subnanometric layers by grazing incidence X-ray reflectometry

Emprin, B., Troussel, Ph., Soullié, G., Stemmler, Ph., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F.
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Volume:
556
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.01.001
Date:
April, 2014
File:
PDF, 837 KB
english, 2014
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