Comparison of atom probe compositional fidelity across thin film interfaces
Brons, J.G., Herzing, A.A., Henry, K.T., Anderson, I.M., Thompson, G.B.Volume:
551
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.11.105
Date:
January, 2014
File:
PDF, 962 KB
english, 2014