Effect of crystallization on the reliability of unipolar resistive-switching in HfO2-based dielectrics
Saleh, M.N., Venkatachalam, D.K., Elliman, R.G.Volume:
14
Language:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2013.11.017
Date:
March, 2014
File:
PDF, 1.49 MB
english, 2014