Investigation on the effect of tunnel oxide nitridation to threshold voltage instability mechanisms of nanoscale CT NVM
Lee, Meng Chuan, Wong, Hin Yong, Lee, LiniVolume:
99
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.04.037
Date:
September, 2014
File:
PDF, 1.39 MB
english, 2014