Analysis of flicker and thermal noise in p-channel Underlap...

Microelectronics Reliability 2014 / 08 Vol. 54; Iss. 8

Analysis of flicker and thermal noise in p-channel Underlap DG FinFET

Swain, Sanjit Kumar, Adak, Sarosij, Pati, Sudhansu Kumar, Pardeshi, Hemant, Sarkar, Chandan Kumar
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.04.002
Date:
August, 2014
File:
PDF, 543 KB
english, 2014
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