Charge transport mechanisms and density of interface traps...

Charge transport mechanisms and density of interface traps in MnZnO/p-Si diodes

Taşçıoğlu, İlke, Farooq, W.A., Turan, Raşit, Altındal, Şemsettin, Yakuphanoglu, Fahrettin
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Volume:
590
Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2013.12.043
Date:
March, 2014
File:
PDF, 979 KB
english, 2014
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