On a new method for measuring the charge carriers drift...

On a new method for measuring the charge carriers drift mobility in high resistivity silicon

A. Alberigi Quaranta, F. Cipolla, M. Martini
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Volume:
17
Year:
1965
Language:
english
DOI:
10.1016/0031-9163(65)90254-4
File:
PDF, 83 KB
english, 1965
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