![](/img/cover-not-exists.png)
Integration aspects of strained Ge pFETs
Witters, L., Eneman, G., Mitard, J., Vincent, B., Hikavyy, A., Milenin, A.P., Mertens, S., Thean, A., Collaert, N.Volume:
98
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.04.009
Date:
August, 2014
File:
PDF, 1.75 MB
english, 2014