Methods for automated detection of plagiarism in...

Methods for automated detection of plagiarism in integrated-circuit layouts

Kasprowicz, Dominik, Wada, Hilekaan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2014.04.023
Date:
September, 2014
File:
PDF, 6.92 MB
english, 2014
Conversion to is in progress
Conversion to is failed