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A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs
Ruan, Aiwu, Jie, Bairui, Wan, Li, Yang, Junhao, Xiang, Chuanyin, Zhu, Zujian, Wang, YuVolume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.03.017
Date:
August, 2014
File:
PDF, 1.20 MB
english, 2014