Effect of field cooling process and ion-beam bombardment on...

Thin Solid Films 2014 / 11 Vol. 570

Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers

Li, X., Lin, K.-W., Liu, H.-Y., Wei, D.-H., Li, G.J., Pong, P.W.T.
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Volume:
570
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.03.032
Date:
November, 2014
File:
PDF, 1.93 MB
english, 2014
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