Characterization of electronic structure in dielectric...

Current Applied Physics 2013 / 3 Vol. 13; Iss. 2

Characterization of electronic structure in dielectric materials by making use of the secondary electron emission

Uhm, Han S., Choi, Joon H., Cho, Guangsup, Park, Byoung J., Jung, Ran J., Choi, Eun H.
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Volume:
13
Language:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2012.08.020
Date:
March, 2013
File:
PDF, 731 KB
english, 2013
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