Extended range phase-sensitive swept source interferometer for real-time dimensional metrology
Shen, Yi, Ding, Zhihua, Yan, Yangzhi, Wang, Chuan, Yang, Yaliang, Zhang, YudongVolume:
318
Language:
english
Journal:
Optics Communications
DOI:
10.1016/j.optcom.2013.12.065
Date:
May, 2014
File:
PDF, 1.60 MB
english, 2014