Positive bias temperature instability of irradiated...

Thin Solid Films 2014 / 04 Vol. 556

Positive bias temperature instability of irradiated n-channel thin film transistors

Jelenković, Emil V., Kovačević, Milan S., Stupar, Dragan Z., Jha, Shrawan, Bajić, Jovan S., Tong, K.Y.
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Volume:
556
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.01.079
Date:
April, 2014
File:
PDF, 490 KB
english, 2014
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