Snapback breakdown ESD device based on zener diodes on...

Microelectronics Reliability 2014 / 06 Vol. 54; Iss. 6-7

Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology

Tam, Wing-Shan, Kok, Chi-Wah, Siu, Sik-Lam, Wong, Hei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.01.014
Date:
June, 2014
File:
PDF, 693 KB
english, 2014
Conversion to is in progress
Conversion to is failed