Parametric defect localization on integrated circuits –...

Microelectronics Reliability 2014 / 02 Vol. 54; Iss. 2

Parametric defect localization on integrated circuits – From static laser stimulation to real-time variation mapping (RTVM)

Saury, L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.11.007
Date:
February, 2014
File:
PDF, 4.19 MB
english, 2014
Conversion to is in progress
Conversion to is failed