Analytical compact modeling and statistical variability study of LDMOS
Zhou, Hongtao, Zhou, Xing, Benistant, FrancisVolume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.10.019
Date:
June, 2014
File:
PDF, 2.35 MB
english, 2014