Low-frequency noise assessment in advanced UTBOX SOI...

Solid-State Electronics 2014 / 07 Vol. 97

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

dos Santos, S.D., Cretu, B., Strobel, V., Routoure, J.-M., Carin, R., Martino, J.A., Aoulaiche, M., Jurczak, M., Simoen, E., Claeys, C.
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Volume:
97
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.04.034
Date:
July, 2014
File:
PDF, 1.27 MB
english, 2014
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