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A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays
Gyepes, G., Stopjaková, V., Arbet, D., Majer, L., Brenkuš, J.Volume:
38
Language:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2014.04.006
Date:
July, 2014
File:
PDF, 1.35 MB
english, 2014