A new IDDT test approach and its efficiency in covering...

Microprocessors and Microsystems 2014 / 07 Vol. 38; Iss. 5

A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays

Gyepes, G., Stopjaková, V., Arbet, D., Majer, L., Brenkuš, J.
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Volume:
38
Language:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2014.04.006
Date:
July, 2014
File:
PDF, 1.35 MB
english, 2014
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