In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Achour, H., Cretu, B., Routoure, J.-M., Carin, R., Talmat, R., Benfdila, A., Simoen, E., Claeys, C.Volume:
98
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.04.001
Date:
August, 2014
File:
PDF, 729 KB
english, 2014