Thermal stability of sectorial split-drain magnetic field-effect transistors
Tam, Wing-Shan, Kok, Chi-Wah, Siu, Sik-Lam, Tang, Wing-Man, Leung, Chi-Wah, Wong, HeiVolume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.12.006
Date:
June, 2014
File:
PDF, 471 KB
english, 2014