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CNx film characterization by surface sensitive methods: XPS and XAES
Dementjev, A.P, de Graaf, A, Dolgiy, D.I, Olshanski, E.D, Shulga, Y.M, Serov, A.AVolume:
8
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(98)00356-2
Date:
March, 1999
File:
PDF, 179 KB
english, 1999